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Selection of Detection System of CMM

Selection of Detection System of CMM

2024-11-05

A typical CMM inspection system consists of four parts: the measuring probe quill, the probe extension, the stylus adjustment or extension, and the stylus.

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How to Make Part Measurement More Accurate

How to Make Part Measurement More Accurate

2024-10-21

In the process of product testing, if it is found that the test data of the same program or the same part during multiple tests are greatly different, the output is inconsistent, or it is different from the actual assembly situation, it needs to be checked and analyzed from several aspects. Here are the main points.

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Vibration Treatment Method of CMM

Vibration Treatment Method of CMM

2024-10-18

In the modern manufacturing industry, CMM is increasingly used in the production process, making the goal and key of product quality gradually change from final inspection to manufacturing process control.

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How to Solve the Problem of Excessive Deviation of Measurement Results

How to Solve the Problem of Excessive Deviation of Measurement Results

2024-10-17

When using the coordinate measuring machine for measurement, if the measurement deviation is too large, then please follow the following method to solve the problem.

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What is the working process of a CMM

What is the working process of a CMM

2024-10-16

The working process of a CMM generally includes preparation, select measurement program, set measurement parameters, data processing, data processing, follow-up processing.

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What are the Forms of the Measuring Probe Quill

What are the Forms of the Measuring Probe Quill

2024-10-15

There are many kinds of CMM probes, mainly divided into fixed, manual rotation, manual rotation automatic indexing, automatic rotation automatic indexing and general detection system.

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What is the difference between CMM and Profilometer

What is the difference between CMM and Profilometer

2024-10-14

CMM focuses on geometric measurements in three-dimensional space, while profilometers focus on surface profile and roughness. CMM are suitable for a wider range of industrial applications, while profilometers are more focused on surface characteristic analysis. 

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Congratulations on the 75th Anniversary of the Founding of PRC

Congratulations on the 75th Anniversary of the Founding of PRC

2024-09-30

At this glorious moment, we jointly celebrate the 75th anniversary of the founding of the People’s Republic of China. 

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How to Eliminate System Errors

How to Eliminate System Errors

2024-09-27

The systematic error of a coordinate measuring machine (CMM) refers to the systematic deviation caused by factors such as the design, manufacturing, installation and use of the equipment itself during the measurement process. These errors are generally predictable and consistent when measurements are repeated under the same conditions. 

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Introduction of Dimensional Deviation

Introduction of Dimensional Deviation

2024-09-23

The dimensional deviation is the algebraic difference of the dimensions minus their nominal dimensions, which can be divided into actual deviation and limit deviation.

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The Function and Significance of Three-dimensional Measurement

The Function and Significance of Three-dimensional Measurement

2024-09-03

The industry has made great progress since the 1960s. With the rise of industrial production machinery, automobiles, aerospace and electronics industries, the development and production of various complex objects require advanced detection technology and instruments, which are reflected in the three coordinate measuring machine and three-dimensional measurement technology came into being, and have been rapidly developed and improved.

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What is the Influence on Scanning Caused by CMM Dynamic Performance

What is the Influence on Scanning Caused by CMM Dynamic Performance

2024-08-26

The scanning measurement is different from the trigger measurement, the measuring machine will bear the inertial load during the whole process, and the dynamic performance is more important than the static performance. Inertial load causes deformation of measuring machine structure, which is difficult to predict.

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